| TBar: Revisiting template-based automated program repair K Liu, A Koyuncu, D Kim, TF Bissyandé Proceedings of the 28th ACM SIGSOFT International Symposium on Software …, 2019 | 248 | 2019 |
| Fixminer: Mining relevant fix patterns for automated program repair A Koyuncu, K Liu, TF Bissyandé, D Kim, J Klein, M Monperrus, Y Le Traon Empirical Software Engineering 25, 1980-2024, 2020 | 192 | 2020 |
| Automated testing of android apps: A systematic literature review P Kong, L Li, J Gao, K Liu, TF Bissyandé, J Klein IEEE Transactions on Reliability 68 (1), 45-66, 2018 | 189 | 2018 |
| Avatar: Fixing semantic bugs with fix patterns of static analysis violations K Liu, A Koyuncu, D Kim, TF Bissyandé 2019 IEEE 26th International Conference on Software Analysis, Evolution and …, 2019 | 169 | 2019 |
| You cannot fix what you cannot find! an investigation of fault localization bias in benchmarking automated program repair systems K Liu, A Koyuncu, TF Bissyandé, D Kim, J Klein, Y Le Traon 2019 12th IEEE conference on software testing, validation and verification …, 2019 | 142 | 2019 |
| Mining fix patterns for findbugs violations K Liu, D Kim, TF Bissyandé, S Yoo, Y Le Traon IEEE Transactions on Software Engineering 47 (1), 165-188, 2018 | 133 | 2018 |
| On the efficiency of test suite based program repair: A systematic assessment of 16 automated repair systems for java programs K Liu, S Wang, A Koyuncu, K Kim, TF Bissyandé, D Kim, P Wu, J Klein, ... Proceedings of the ACM/IEEE 42nd International Conference on Software …, 2020 | 128 | 2020 |
| Learning to spot and refactor inconsistent method names K Liu, D Kim, TF Bissyandé, T Kim, K Kim, A Koyuncu, S Kim, Y Le Traon 2019 IEEE/ACM 41st International Conference on Software Engineering (ICSE), 1-12, 2019 | 115 | 2019 |
| Evaluating representation learning of code changes for predicting patch correctness in program repair H Tian, K Liu, AK Kaboré, A Koyuncu, L Li, J Klein, TF Bissyandé Proceedings of the 35th IEEE/ACM International Conference on Automated …, 2020 | 96 | 2020 |
| iFixR: Bug report driven program repair A Koyuncu, K Liu, TF Bissyandé, D Kim, M Monperrus, J Klein, Y Le Traon Proceedings of the 2019 27th ACM joint meeting on european software …, 2019 | 95 | 2019 |
| LSRepair: Live search of fix ingredients for automated program repair K Liu, A Koyuncu, K Kim, D Kim, TF Bissyandé 2018 25th Asia-Pacific Software Engineering Conference (APSEC), 658-662, 2018 | 73 | 2018 |
| A critical review on the evaluation of automated program repair systems K Liu, L Li, A Koyuncu, D Kim, Z Liu, J Klein, TF Bissyandé Journal of Systems and Software 171, 110817, 2021 | 65 | 2021 |
| A closer look at real-world patches K Liu, D Kim, A Koyuncu, L Li, TF Bissyandé, Y Le Traon 2018 IEEE International Conference on Software Maintenance and Evolution …, 2018 | 55 | 2018 |
| Exploring how deprecated Python library APIs are (not) handled J Wang, L Li, K Liu, H Cai Proceedings of the 28th acm joint meeting on european software engineering …, 2020 | 45 | 2020 |
| D&c: A divide-and-conquer approach to ir-based bug localization A Koyuncu, TF Bissyandé, D Kim, K Liu, J Klein, M Monperrus, YL Traon arXiv preprint arXiv:1902.02703, 2019 | 31 | 2019 |
| On the impact of flaky tests in automated program repair Y Qin, S Wang, K Liu, X Mao, TF Bissyandé 2021 IEEE International Conference on Software Analysis, Evolution and …, 2021 | 23 | 2021 |
| Predicting patch correctness based on the similarity of failing test cases H Tian, Y Li, W Pian, AK Kabore, K Liu, A Habib, J Klein, TF Bissyandé ACM Transactions on Software Engineering and Methodology (TOSEM) 31 (4), 1-30, 2022 | 20 | 2022 |
| Where were the repair ingredients for Defects4j bugs? Exploring the impact of repair ingredient retrieval on the performance of 24 program repair systems D Yang, K Liu, D Kim, A Koyuncu, K Kim, H Tian, Y Lei, X Mao, J Klein, ... Empirical Software Engineering 26, 1-33, 2021 | 20 | 2021 |
| Automated comment update: How far are we? B Lin, S Wang, K Liu, X Mao, TF Bissyandé 2021 IEEE/ACM 29th International Conference on Program Comprehension (ICPC …, 2021 | 20 | 2021 |
| The best of both worlds: integrating semantic features with expert features for defect prediction and localization C Ni, W Wang, K Yang, X Xia, K Liu, D Lo Proceedings of the 30th ACM Joint European Software Engineering Conference …, 2022 | 16 | 2022 |
Tegawendé F. BissyandéChief Scientist II / ERC Fellow / TruX @SnT, University of LuxembourgVerified email at uni.lu
