Compact modeling of impact ionization in high-voltage devices G Gill, A Singhal, G Pahwa, C Hu, H Agarwal IEEE Transactions on Electron Devices, 2023 | 4 | 2023 |
Role of negative differential resistance in improving analog performance of negative capacitance FETs A Singhal, Y Machhiwar, H Agarwal 2022 IEEE International Conference on Emerging Electronics (ICEE), 1-6, 2022 | 2 | 2022 |
Physics informed neural network based time-independent Schrödinger equation solver A Singhal, H Agarwal 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2024 | 1 | 2024 |
Energy‐efficient adaptive clustering (EEAC) with rendezvous nodes and mobile sink P Gupta, A Verma, P Gupta, O Maheshwari, A Singhal, M Kumar International Journal of Communication Systems, 1-16, 2023 | 1 | 2023 |
An Improved Robust Infinitely Differentiable Drift Resistance Model for BSIM High Voltage Compact Model A Singhal, G Gill, G Pahwa, C Hu, H Agarwal 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2023 | 1 | 2023 |
A Novel Physics Aware ANN-Based Framework for BSIM-CMG Model Parameter Extraction A Singhal, G Pahwa, H Agarwal IEEE Transactions on Electron Devices, 2024 | | 2024 |
Survey: advancement in materials and trends in various fields of 3D printing O Maheshwari, A Singhal, V Pachaulee, M Trehan, PK Gupta Advances in VLSI, Communication, and Signal Processing: Select Proceedings …, 2022 | | 2022 |