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Gregory Allen
Gregory Allen
NASA Jet Propulsion Laboratory
Verified email at jpl.nasa.gov
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Cited by
Cited by
Year
Virtex-4 VQ static SEU characterization summary
G Allen, G Swift, C Carmichael
Pasadena, CA: Jet Propulsion Laboratory, National Aeronautics and Space …, 2008
1142008
Assessing and mitigating radiation effects in Xilinx SRAM FPGAs
P Adell, G Allen, G Swift, S McClure
2008 European Conference on Radiation and Its Effects on Components and …, 2008
1032008
Nanosatellites for earth environmental monitoring: The MicroMAS project
W Blackwell, G Allen, C Galbraith, T Hancock, R Leslie, I Osaretin, ...
2012 12th Specialist Meeting on Microwave Radiometry and Remote Sensing of …, 2012
882012
Total dose effects in CMOS trench isolation regions
AH Johnston, RT Swimm, GR Allen, TF Miyahira
IEEE Transactions on Nuclear Science 56 (4), 1941-1949, 2009
602009
Single-event characterization of the 20 nm Xilinx Kintex UltraScale field-programmable gate array under heavy ion irradiation
DS Lee, GR Allen, G Swift, M Cannon, M Wirthlin, JS George, R Koga, ...
2015 IEEE Radiation Effects Data Workshop (REDW), 1-6, 2015
582015
Comparison of single event transients generated at four pulsed-laser test facilities-NRL, IMS, EADS, JPL
S Buchner, N Roche, J Warner, D McMorrow, F Miller, S Morand, ...
IEEE Transactions on Nuclear Science 59 (4), 988-998, 2012
572012
MicroMAS: A first step towards a nanosatellite constellation for global storm observation
W Blackwell, G Allen, C Galbraith, R Leslie, I Osaretin, M Scarito, ...
482013
Static upset characteristics of the 90nm Virtex-4QV FPGAs
GM Swift, GR Allen, CW Tseng, C Carmichael, G Miller, JS George
2008 IEEE Radiation Effects Data Workshop, 98-105, 2008
402008
Single-event upset (SEU) results of embedded error detect and correct enabled block random access memory (block RAM) within the xilinx XQR5VFX130
GR Allen, L Edmonds, CW Tseng, G Swift, C Carmichael
IEEE Transactions on Nuclear Science 57 (6), 3426-3431, 2010
392010
Single event effects test results for advanced field programmable gate arrays
GR Allen, GM Swift
2006 IEEE Radiation Effects Data Workshop, 115-120, 2006
362006
Compendium of XRTC radiation results on all single-event effects observed in the Virtex-5QV
G Swift, C Carmichael, G Allen, G Madias, E Miller, R Monreal
Proceedings of NASA military and aerospace programmable logic devices (MAPLD …, 2011
302011
2015 compendium of recent test results of single event effects conducted by the jet propulsion laboratory's radiation effects group
GR Allen, LZ Scheick, F Irom, SM Guertin, PC Adell, M Amrbar, ...
2015 IEEE Radiation Effects Data Workshop (REDW), 1-14, 2015
282015
Single event latchup (SEL) and total ionizing dose (TID) of a 1 Mbit magnetoresistive random access memory (MRAM)
J Heidecker, G Allen, D Sheldon
2010 IEEE Radiation Effects Data Workshop, 4-4, 2010
272010
Compendium of test results of single event effects conducted by the jet propulsion laboratory
GR Allen
2008 IEEE Radiation Effects Data Workshop, 21-30, 2008
272008
Single event effect and total ionizing dose results of highly scaled flash memories
F Irom, DN Nguyen, GR Allen
2013 IEEE Radiation Effects Data Workshop (REDW), 1-4, 2013
252013
The design and use of special purpose processors for the machine processing of remotely sensed data
GR Allen, LO Bonrud, JJ Cosgrove, RM Stone
201973
Single-event transient testing of low dropout PNP series linear voltage regulators
GR Allen, PC Adell, D Chen, P Musil
IEEE Transactions on Nuclear Science 59 (6), 2764-2771, 2012
192012
Scaling effects in highly scaled commercial nonvolatile flash memories
F Irom, DN Nguyen, GR Allen, SA Zajac
2012 IEEE Radiation Effects Data Workshop, 1-6, 2012
172012
Single event test methodologies and system error rate analysis for triple modular redundant field programmable gate arrays
G Allen, LD Edmonds, G Swift, C Carmichael, CW Tseng, K Heldt, ...
IEEE Transactions on Nuclear Science 58 (3), 1040-1046, 2011
172011
Upset characterization and test methodology of the PowerPC405 hard-core processor embedded in Xilinx field programmable gate arrays
GR Allen, GM Swift, G Miller
2007 IEEE Radiation Effects Data Workshop, 167-171, 2007
172007
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