| Impact of random spatial fluctuation in non-uniform crystalline phases on the device variation of ferroelectric FET C Garg, N Chauhan, S Deng, AI Khan, S Dasgupta, A Bulusu, K Ni IEEE Electron Device Letters 42 (8), 1160-1163, 2021 | 30 | 2021 |
| A novel twofold tunnel FET with reduced miller capacitance: proposal and investigation N Bagga, N Chauhan, D Gupta, S Dasgupta IEEE Transactions on Electron Devices 66 (7), 3202-3208, 2019 | 20 | 2019 |
| Negative-to-positive differential resistance transition in ferroelectric FET: physical insight and utilization in analog circuits N Chauhan, N Bagga, S Banchhor, A Datta, S Dasgupta, A Bulusu IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control 69 …, 2021 | 15 | 2021 |
| BOX engineering to mitigate negative differential resistance in MFIS negative capacitance FDSOI FET: an analog perspective N Chauhan, N Bagga, S Banchhor, C Garg, A Sharma, A Datta, ... Nanotechnology 33 (8), 085203, 2021 | 13 | 2021 |
| Performance optimization of analog circuits in negative capacitance transistor technology O Prakash, N Chauhan, A Gupta, H Amrouch Microelectronics Journal 115, 105193, 2021 | 13 | 2021 |
| Demonstration of a novel tunnel FET with channel sandwiched by drain N Bagga, N Chauhan, S Banchhor, D Gupta, S Dasgupta Semiconductor Science and Technology 35 (1), 015008, 2019 | 13 | 2019 |
| Investigation of trap-induced performance degradation and restriction on higher ferroelectric thickness in negative capacitance FDSOI FET C Garg, N Chauhan, A Sharma, S Banchhor, A Doneria, S Dasgupta, ... IEEE Transactions on Electron Devices 68 (10), 5298-5304, 2021 | 12 | 2021 |
| Traps based reliability barrier on performance and revealing early ageing in negative capacitance FET A Gupta, G Bajpai, P Singhal, N Bagga, O Prakash, S Banchhor, ... 2021 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2021 | 12 | 2021 |
| Cleaved-gate ferroelectric FET for reliable multi-level cell storage N Bagga, K Ni, N Chauhan, O Prakash, XS Hu, H Amrouch 2022 IEEE International Reliability Physics Symposium (IRPS), P5-1-P5-5, 2022 | 10 | 2022 |
| Real time implementation of convolutional neural network to detect plant diseases using internet of things G Bajpai, A Gupta, N Chauhan VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India …, 2019 | 10 | 2019 |
| Physical cause and impact of negative capacitance effect in ferroelectric P (VDF-TrFE) gate stack and its application to landau transistor KJ Singh, N Chauhan, A Bulusu, S Dasgupta IEEE Open Journal of Ultrasonics, Ferroelectrics, and Frequency Control 2, 55-64, 2022 | 7 | 2022 |
| Variability Effects in FinFET Transistors and Emerging NC-FinFET A Gupta, N Chauhan, O Prakash, H Amrouch 2021 International Conference on IC Design and Technology (ICICDT), 1-4, 2021 | 6 | 2021 |
| Impact of random spatial fluctuation in non-uniform crystalline phases on multidomain MFIM capacitor and negative capacitance FDSOI N Chauhan, C Garg, K Ni, AK Behera, S Yadav, S Banchhor, N Bagga, ... 2022 IEEE International Reliability Physics Symposium (IRPS), P23-1-P23-6, 2022 | 5 | 2022 |
| A new physical insight into the zero-temperature coefficient with self-heating in silicon-on-insulator fin field-effect transistors S Banchhor, N Chauhan, B Anand Semiconductor Science and Technology 36 (3), 035005, 2021 | 4 | 2021 |
| Gain stabilization methodology for FinFET amplifiers considering self-heating effect S Banchhor, N Chauhan, A Doneria, B Anand 2021 34th International Conference on VLSI Design and 2021 20th …, 2021 | 3 | 2021 |
| Demonstration of a novel ferroelectric-dielectric negative capacitance tunnel FET N Bagga, N Chauhan, A Bulusu, S Dasgupta 2019 IEEE Conference on Modeling of Systems Circuits and Devices (MOS-AK …, 2019 | 3 | 2019 |
| On the resiliency of nc-finfet srams against variation: Mfis structure A Gupta, N Chauhan, O Prakash, H Amrouch 2021 International Conference on Simulation of Semiconductor Processes and …, 2021 | 2 | 2021 |
| Through-silicon-via induced stress-aware FinFET buffer sizing in 3D ICs S Yadav, N Chauhan, R Chawla, A Sharma, S Banchhor, R Pratap, ... Semiconductor Science and Technology 37 (8), 085023, 2022 | 1 | 2022 |
| A physical insight into variation aware minimum V DD for deep subthreshold operation of FinFET S Yadav, N Chauhan, S Tyagi, A Sharma, S Banchhor, R Joshi, R Pratap, ... Semiconductor Science and Technology 36 (12), 125002, 2021 | 1 | 2021 |
| Analysis of Transient Negative Capacitance Characteristics for Stabilization and Amplification N Chauhan, G Bajpai, S Banchhor, N Bagga 2020 24th International Symposium on VLSI Design and Test (VDAT), 1-5, 2020 | 1 | 2020 |
Bulusu AnandIndian Institute of Technology RoorkeePotvrđena adresa e-pošte na ece.iitr.ac.in
