Testing and diagnostics of CMOS circuits using light emission from off-state leakage current F Stellari, P Song, JC Tsang, MK McManus, MB Ketchen IEEE transactions on electron devices 51 (9), 1455-1462, 2004 | 74 | 2004 |
Picosecond imaging circuit analysis of leakage currents in CMOS circuits S Polonsky, A Weger, M McManus ISTFA 2002, 387-390, 2002 | 54 | 2002 |
Model-based guidelines to suppress cable discharge event (CDE) induced latchup in CMOS ICs K Chatty, P Cottrell, R Gauthier, M Muhammad, F Stellari, A Weger, ... 2004 IEEE International Reliability Physics Symposium. Proceedings, 130-134, 2004 | 47 | 2004 |
Diagnosis and characterization of timing-related defects by time-dependent light emission D Knebel, P Sanda, M McManus, JA Kash, JC Tsang, D Vallett, ... Proceedings International Test Conference 1998 (IEEE Cat. No. 98CH36270 …, 1998 | 46 | 1998 |
Transmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latchup A Weger, S Voldman, F Stellari, P Song, P Sanda, M McManus 2003 IEEE International Reliability Physics Symposium Proceedings, 2003 …, 2003 | 38 | 2003 |
Diagnostic techniques for the IBM S/390 600 MHz G5 microprocessor P Song, F Motika, D Knebel, R Rizzolo, M Kusko, J Lee, M McManus International Test Conference 1999. Proceedings (IEEE Cat. No. 99CH37034 …, 1999 | 33 | 1999 |
The attack of the" Holey Shmoos": a case study of advanced DFD and picosecond imaging circuit analysis (PICA) W Huott, M McManus, D Knebel, S Steen, D Manzer, P Sanda, S Wilson, ... International Test Conference 1999. Proceedings (IEEE Cat. No. 99CH37034 …, 1999 | 29 | 1999 |
Circuit voltage probe based on time-integrated measurements of optical emission from leakage current F Stellari, P Song, JC Tsang, MK McManus, MB Ketchen ISTFA 2002, 667-672, 2002 | 28 | 2002 |
Optical diagnosis of excess IDDQ in low power CMOS circuits F Stellari, P Song, JC Tsang, MK McManus, MB Ketchen Microelectronics Reliability 42 (9-11), 1689-1694, 2002 | 26 | 2002 |
Time-resolved optical measurements from 0.13 μm CMOS technology microprocessor using a Superconducting Single-Photon Detector F Stellari, P Song, AJ Weger, MK McManus ISTFA 2003, 40-44, 2003 | 22 | 2003 |
Picosecond imaging circuit analysis of the IBM G6 microprocessor cache M McManus, P Sanda, S Steen, D Knebel, D Manzer, S Polonsky, B Huott, ... ISTFA 1999, 35-38, 1999 | 19 | 1999 |
Study of critical factors determining latchup sensitivity of ICs using emission microscopy F Stellari, P Song, MK McManus, AJ Weger, RJ Gauthier, KV Chatty, ... ISTFA 2003, 19-24, 2003 | 14 | 2003 |
Non-invasive timing analysis of IBM G6 microprocessor L1 cache using backside time-resolved hot electron luminescence S Polonsky, D Knebel, P Sanda, M McManus, W Huott, A Pelella, ... 2000 IEEE International Solid-State Circuits Conference. Digest of Technical …, 2000 | 13 | 2000 |
An advanced optical diagnostic technique of IBM z990 eServer microprocessor P Song, F Stellari, B Huott, O Wagner, U Srinivasan, Y Chan, R Rizzolo, ... IEEE International Conference on Test, 2005., 9 pp.-1235, 2005 | 11 | 2005 |
Power and performance sorting of microprocessors from first interconnect layer to wafer final test E Acar, MK McManus, SR Nassif, MJ Sullivan US Patent 10,474,774, 2019 | 10 | 2019 |
Testing and operating a multiprocessor chip with processor redundancy RE Bellofatto, SM Douskey, RA Haring, MK McManus, M Ohmacht, ... US Patent 8,868,975, 2014 | 10 | 2014 |
System and method for spatial, temporal, energy-resolving detection of single photons SV Polonsky, RH Koch, MK McManus US Patent 7,078,694, 2006 | 10 | 2006 |
An advanced optical diagnostic technique for IBM microprocessor P Song, F Stellari, B Huott, O Wagner, U Srinivasan, Y Chan, R Rizzolo, ... Proc. of International Test Conference (ITC), 48.1-48.9, 2005 | 10 | 2005 |
Design for low power and power management in IBM Blue Gene/Q K Sugavanam, CY Cher, JA Gunnels, RA Haring, P Heidelberger, ... IBM Journal of Research and Development 57 (1/2), 3: 1-3: 11, 2013 | 9 | 2013 |
Design of the IBM Blue Gene/Q compute chip RA Haring IBM Journal of Research and Development 57 (1), 1-12, 2013 | 9 | 2013 |