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Sve | Od 2019. | |
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Citati | 1123 | 967 |
H-indeks | 12 | 11 |
i10-indeks | 14 | 12 |
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Suautori
- Minghao QiPurdue UniversityPotvrđena adresa e-pošte na purdue.edu
- Andrew M. WeinerProfessor of Electrical and Computer Engineering, Purdue UniversityPotvrđena adresa e-pošte na purdue.edu
- Yi XUANUniversity of Pittsburgh, School of MedicinePotvrđena adresa e-pošte na pitt.edu
- Sangsik KimAssociate Professor of Electrical Engineering, Korea Advanced Institute of Science and TechnologyPotvrđena adresa e-pošte na kaist.ac.kr
- Jose Jaramillo-VillegasPurdue University, Universidad Tecnológica de PereiraPotvrđena adresa e-pošte na utp.edu.co
- Min TengimecPotvrđena adresa e-pošte na imec-int.com
- Abdullah Al NomanFailure Analysis R&D Engineer at Intel CorporationPotvrđena adresa e-pošte na intel.com
- Victor YurlovPrincipal Engineer of Samsung Electromechanics (Optics, MEMS, ISP)Potvrđena adresa e-pošte na samsung.com
- Vladimir A. AksyukProject Leader, Physical Measurement Laboratory, NISTPotvrđena adresa e-pošte na nist.gov
- Thomas LeBrunGroup Leader for Photonics and Optomechanics, NISTPotvrđena adresa e-pošte na nist.gov
- Junyeob SongNational Institute of Standards and Technology & University of DelawarePotvrđena adresa e-pošte na NIST.GOV
- David LongNational Institute of Standards and TechnologyPotvrđena adresa e-pošte na nist.gov
- Nan Ei Yu (N. E. Yu)Gwngju Institute of Science and Technology (GIST)Potvrđena adresa e-pošte na gist.ac.kr