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Citirano
Sve | Od 2019. | |
---|---|---|
Citati | 437 | 286 |
H-indeks | 14 | 11 |
i10-indeks | 15 | 11 |
Suautori
- Changhwan ShinProfessor at Korea UniversityPotvrđena adresa e-pošte na korea.ac.kr
- Jung-Dong ParkProfessor at Dongguk University, SeoulPotvrđena adresa e-pošte na dongguk.edu
- Van-Son TrinhSenior Engineer at NewratekPotvrđena adresa e-pošte na newratek.com
- Van-Viet NguyenSynopsys VietnamPotvrđena adresa e-pošte na dongguk.edu
- Hyunjae LeeUniversity of WaterlooPotvrđena adresa e-pošte na uwaterloo.ca
- Jin-Hong ParkSchool of Electrical and Computer Engineering, Sungkyunkwan University (SKKU)Potvrđena adresa e-pošte na skku.edu
- Jeong-Kyu KimStanford UniversityPotvrđena adresa e-pošte na stanford.edu
- Kim, Gwang-SikSamsung ElectronicsPotvrđena adresa e-pošte na korea.ac.kr
- Byung Jin ChoKAISTPotvrđena adresa e-pošte na kaist.edu
- Krishna SaraswatProfessor of Electrical Engineering, Stanford UniversityPotvrđena adresa e-pošte na stanford.edu
- In Jun ParkIndiana University Purdue University, Indianapolis (IUPUI)Potvrđena adresa e-pošte na iu.edu
Prati
Hyohyun Nam
6G Research Team, Samsung Research
Potvrđena adresa e-pošte na samsung.com - Početna stranica