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Daniel Holcomb
Daniel Holcomb
Associate Professor, University of Massachusetts
Verified email at engin.umass.edu - Homepage
Title
Cited by
Cited by
Year
Power-up SRAM state as an identifying fingerprint and source of true random numbers
DE Holcomb, WP Burleson, K Fu
IEEE Transactions on Computers 58 (9), 1198-1210, 2008
10642008
Initial SRAM state as a fingerprint and source of true random numbers for RFID tags
DE Holcomb, WP Burleson, K Fu
Proceedings of the Conference on RFID Security 7 (2), 01, 2007
5142007
PUFs at a glance
U Rührmair, DE Holcomb
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2014
2082014
FPGA Side Channel Attacks without Physical Access
C Ramesh, SB Patil, SN Dhanuskodi, G Provelengios, S Pillement, ...
Field-Programmable Custom Computing Machines (FCCM), 2018 IEEE 26th Annual …, 2018
1752018
Physical Design Obfuscation of Hardware: A Comprehensive Investigation of Device-and Logic-Level Techniques
A Vijayakumar, VC Patil, DE Holcomb, C Paar, S Kundu
IEEE Transactions on Information Forensics and Security, 2016
1292016
Low-power sub-threshold design of secure physical unclonable functions
L Lin, D Holcomb, DK Krishnappa, P Shabadi, W Burleson
Proceedings of the 16th ACM/IEEE international symposium on Low power …, 2010
1112010
Persistent Clocks for Batteryless Sensing Devices
J HESTER, N TOBIAS, A RAHMATI, L SITANAYAH, D HOLCOMB, K FU, ...
ACM Transactions on Embedded Computing Systems (TECS) 15 (4), 77:1--77:28, 2016
1042016
TARDIS: Time and Remanence Decay in SRAM to Implement Secure Protocols on Embedded Devices without Clocks.
A Rahmati, M Salajegheh, DE Holcomb, J Sorber, WP Burleson, K Fu
USENIX Security Symposium, 221-236, 2012
992012
Incremental SAT-based reverse engineering of camouflaged logic circuits
C Yu, X Zhang, D Liu, M Ciesielski, D Holcomb
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2017
842017
A provable key destruction scheme based on memristive crossbar arrays
H Jiang, C Li, R Zhang, P Yan, P Lin, Y Li, JJ Yang, D Holcomb, Q Xia
Nature Electronics 1 (10), 548-554, 2018
832018
Characterizing Power Distribution Attacks in Multi-User FPGA Environments
G Provelengios, D Holcomb, R Tessier
2019 29th International Conference on Field Programmable Logic and …, 2019
802019
Design as you see FIT: System-level soft error analysis of sequential circuits
D Holcomb, W Li, SA Seshia
2009 Design, Automation & Test in Europe Conference & Exhibition, 785-790, 2009
772009
Nanoscale diffusive memristor crossbars as physical unclonable functions
R Zhang, H Jiang, ZR Wang, P Lin, Y Zhuo, D Holcomb, DH Zhang, ...
Nanoscale 10 (6), 2721-2726, 2018
762018
Efficient PUF-Based Key Generation in FPGAs Using Per-Device Configuration
MA Usmani, S Keshavarz, E Matthews, L Shannon, R Tessier, ...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 27 (2), 364-375, 2018
722018
Bitline PUF: building native challenge-response PUF capability into any SRAM
DE Holcomb, K Fu
Cryptographic Hardware and Embedded Systems–CHES 2014: 16th International …, 2014
662014
Security evaluation and enhancement of bistable ring PUFs
X Xu, U Rührmair, DE Holcomb, W Burleson
Radio Frequency Identification: 11th International Workshop, RFIDsec 2015 …, 2015
652015
Power Side-Channel Attacks on BNN Accelerators in Remote FPGAs
S Moini, S Tian, D Holcomb, J Szefer, R Tessier
IEEE Journal on Emerging and Selected Topics in Circuits and Systems 11 (2 …, 2021
622021
Trajectory model validation using newly developed altitude‐controlled balloons during the International Consortium for Atmospheric Research on Transport and Transformations …
EE Riddle, PB Voss, A Stohl, D Holcomb, D Maczka, K Washburn, ...
Journal of Geophysical Research: Atmospheres 111 (D23), 2006
622006
Oracle-Guided Incremental SAT Solving to Reverse Engineer Camouflaged Logic Circuits
D Liu, C Yu, X Zhang, D Holcomb
Proceedings of Design Automation and Test in Europe (DATE '16), 433-438, 2016
602016
Using statistical models to improve the reliability of delay-based PUFs
X Xu, W Burleson, DE Holcomb
2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 547-552, 2016
582016
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