Prati
Darko Vasic
Darko Vasic
Professor, University of Zagreb, Faculty of Electrical Engineering and Computing
Potvrđena adresa e-pošte na fer.unizg.hr - Početna stranica
Naslov
Citirano
Citirano
Godina
Pulsed eddy-current nondestructive testing of ferromagnetic tubes
D Vasic, V Bilas, D Ambrus
IEEE transactions on instrumentation and measurement 53 (4), 1289-1294, 2004
1642004
Analytical modelling in low-frequency electromagnetic measurements of steel casing properties
D Vasić, V Bilas, B Šnajder
NDT & E International 40 (2), 103-111, 2007
452007
Robust Estimation of Metal Target Shape Using Time-Domain Electromagnetic Induction Data
D Ambruš, D Vasić, V Bilas
IEEE Transactions on Instrumentation and Measurement 65 (4), 795-807, 2016
402016
Validation of a coil impedance model for simultaneous measurement of electromagnetic properties and inner diameter of a conductive tube
D Vasic, V Bilas, D Ambrus
IEEE transactions on instrumentation and measurement 55 (1), 337-342, 2006
392006
A system identification approach to the modelling of pulsed eddy-current systems
M Dadić, D Vasić, V Bilas
NDT & E International 38 (2), 107-111, 2005
262005
Comparative Study of Planar Coil EMI Sensors for Inversion-Based Detection of Buried Objects
D Ambruš, D Vasić, V Bilas
IEEE Sensors Journal 20 (2), 968-979, 2019
192019
Computation of the Eigenvalues for Bounded Domain Eddy-Current Models With Coupled Regions
D Vasić, D Ambruš, V Bilas
IEEE Transactions on Magnetics 52 (6), 1-10, 2016
172016
Scaled Experimental Verification of Single-Well Induction Conductivity Measurement Through Nonmagnetic Casing
D Vasić, V Bilas, AJ Peyton
IEEE Transactions on Instrumentation and Measurement 62 (5), 1199-1206, 2013
172013
Application of stochastic inversion to casing effect correction in through casing induction logging
D Vasic, V Bilas
IEEE Transactions on Instrumentation and Measurement 61 (5), 1458-1465, 2012
172012
Measurement of ferromagnetic tube wall thickness using pulsed remote field technique
D Vasić, V Bilas, D Ambruš
Proceedings of the 12th IMEKO TC4 International Symposium Electrical …, 2002
162002
Automatic compensation of primary field coupling for a frequency-domain electromagnetic induction sensor
D Ambruš, D Vasić, V Bilas
2017 IEEE International Instrumentation and Measurement Technology …, 2017
142017
Spectroscopic identification of anti-personnel mine surrogates from planar sensor measurements
LA Marsh, JL Davidson, M D O'Toole, AJ Peyton, D Ambras, D Vasic, ...
2016 IEEE SENSORS, 1-3, 2016
142016
Close-Range Electromagnetic Tracking of Pulse Induction Search Coils for Subsurface Sensing
D Ambruš, M Šimić, D Vasić, V Bilas
IEEE Transactions on Instrumentation and Measurement 70, 1-13, 2021
132021
Active induction balance method for metal detector sensing head utilizing transmitter-bucking and dual current source
D Ambruš, D Vasić, V Bilas
Journal of Physics: Conference Series 450 (1), 012047, 2013
132013
On feasibility of inductive conductivity measurement of formation surrounding a metal casing
D Vasic, V Bilas, T Devcic
2008 IEEE Instrumentation and Measurement Technology Conference, 186-189, 2008
132008
Innovating on top of I&M fundamentals for safer humanitarian demining
D Ambruš, D Vasić, V Bilas
IEEE Instrumentation & Measurement Magazine 23 (3), 35-41, 2020
92020
UWB localization for discrimination-enabled metal detectors in humanitarian demining
Z Hölbling, H Mihaldinec, D Ambruš, H Džapo, V Bilas, D Vasić
2017 IEEE Sensors Applications Symposium (SAS), 1-4, 2017
92017
Model-based target classification using spatial and temporal features of metal detector response
D Ambruš, D Vasić, V Bilas
2015 IEEE Sensors Applications Symposium (SAS), 1-6, 2015
92015
A digital tachometer for high-temperature telemetry utilizing thermally uprated commercial electronic components
D Ambrus, V Bilas, D Vasic
IEEE transactions on instrumentation and measurement 54 (4), 1361-1365, 2005
92005
Lumped representation in inductive measurement of metal casing properties
D Vasić, V Bilas
Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE …, 2010
82010
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