Traps Based Reliability Barrier on Performance and Revealing Early Ageing in Negative Capacitance FET A Gupta, G Bajpai, P Singhal, N Bagga, O Prakash, S Banchhor, ... 2021 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2021 | 12 | 2021 |
Impact of Radiation on Negative Capacitance FinFET G Bajpai, A Gupta, O Prakash, G Pahwa, J Henkel, YS Chauhan, ... 2020 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2020 | 10 | 2020 |
Real Time Implementation of Convolutional Neural Network to Detect Plant Diseases Using Internet of Things G Bajpai, A Gupta, N Chauhan International Symposium on VLSI Design and Test, 510-522, 2019 | 10 | 2019 |
BEOL Compatible Ferroelectric Routers for Run-time Reconfigurable Compute-in-Memory Accelerators A Khanna, H Ye, Y Luo, G Bajpai, M San Jose, W Chakraborty, S Yu, ... 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and …, 2022 | 2 | 2022 |
Soft Errors in Negative Capacitance FDSOI SRAMs G Bajpai, A Gupta, O Prakash, YS Chauhan, H Amrouch 2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2021 | 2 | 2021 |
Analysis of Transient Negative Capacitance Characteristics for Stabilization and Amplification N Chauhan, G Bajpai, S Banchhor, N Bagga 2020 24th International Symposium on VLSI Design and Test (VDAT), 1-5, 2020 | 1 | 2020 |
Automated Designing of Single Stage Operational Amplifier and Its Teleportation Among Different Technology Nodes A Gupta, G Bajpai, AK Patel, UM Bhatt, N Chauhan 2020 International Conference on Electrical and Electronics Engineering …, 2020 | | 2020 |