Prati
Govind Bajpai
Govind Bajpai
University of Notre Dame, USA | KIT, Germany | IIT Roorkee | NIT Uttarakhand
Potvrđena adresa e-pošte na nd.edu
Naslov
Citirano
Citirano
Godina
Traps Based Reliability Barrier on Performance and Revealing Early Ageing in Negative Capacitance FET
A Gupta, G Bajpai, P Singhal, N Bagga, O Prakash, S Banchhor, ...
2021 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2021
122021
Impact of Radiation on Negative Capacitance FinFET
G Bajpai, A Gupta, O Prakash, G Pahwa, J Henkel, YS Chauhan, ...
2020 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2020
102020
Real Time Implementation of Convolutional Neural Network to Detect Plant Diseases Using Internet of Things
G Bajpai, A Gupta, N Chauhan
International Symposium on VLSI Design and Test, 510-522, 2019
102019
BEOL Compatible Ferroelectric Routers for Run-time Reconfigurable Compute-in-Memory Accelerators
A Khanna, H Ye, Y Luo, G Bajpai, M San Jose, W Chakraborty, S Yu, ...
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and …, 2022
22022
Soft Errors in Negative Capacitance FDSOI SRAMs
G Bajpai, A Gupta, O Prakash, YS Chauhan, H Amrouch
2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2021
22021
Analysis of Transient Negative Capacitance Characteristics for Stabilization and Amplification
N Chauhan, G Bajpai, S Banchhor, N Bagga
2020 24th International Symposium on VLSI Design and Test (VDAT), 1-5, 2020
12020
Automated Designing of Single Stage Operational Amplifier and Its Teleportation Among Different Technology Nodes
A Gupta, G Bajpai, AK Patel, UM Bhatt, N Chauhan
2020 International Conference on Electrical and Electronics Engineering …, 2020
2020
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