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Ming Yan
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Deep learning library testing via effective model generation
Z Wang, M Yan, J Chen, S Liu, D Zhang
Proceedings of the 28th ACM Joint Meeting on European Software Engineering …, 2020
1142020
Practical accuracy estimation for efficient deep neural network testing
J Chen, Z Wu, Z Wang, H You, L Zhang, M Yan
ACM Transactions on Software Engineering and Methodology (TOSEM) 29 (4), 1-35, 2020
692020
Exposing numerical bugs in deep learning via gradient back-propagation
M Yan, J Chen, X Zhang, L Tan, G Wang, Z Wang
Proceedings of the 29th ACM Joint Meeting on European Software Engineering …, 2021
302021
Revisiting deep neural network test coverage from the test effectiveness perspective
M Yan, J Chen, X Cao, Z Wu, Y Kang, Z Wang
Journal of Software: Evolution and Process, e2561, 2023
26*2023
深度神经网络测试研究综述
王 赞 , 闫 明 , 刘 爽, 陈俊洁, 张栋迪, 吴 卓陈 翔
软件学报 5 (31), 1255-1275, 2020
62020
An empirical study on numerical bugs in deep learning programs
G Wang, Z Wang, J Chen, X Chen, M Yan
Proceedings of the 37th IEEE/ACM International Conference on Automated …, 2022
32022
Coco: Testing code generation systems via concretized instructions
M Yan, J Chen, JM Zhang, X Cao, C Yang, M Harman
arXiv preprint arXiv:2308.13319, 2023
22023
Stratified random sampling for neural network test input selection
Z Wu, Z Wang, J Chen, H You, M Yan, L Wang
Information and Software Technology 165, 107331, 2024
12024
Achieving Last-Mile Functional Coverage in Testing Chip Design Software Implementations
M Yan, J Chen, H Mao, J Jiang, J Hao, X Li, Z Tian, Z Chen, D Li, Z Xian, ...
2023 IEEE/ACM 45th International Conference on Software Engineering …, 2023
2023
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