| Impact of extrinsic variation sources on the device-to-device variation in ferroelectric FET K Ni, A Gupta, O Prakash, S Thomann, XS Hu, H Amrouch 2020 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2020 | 51 | 2020 |
| Temperature dependence and temperature-aware sensing in ferroelectric FET A Gupta, K Ni, O Prakash, XS Hu, H Amrouch 2020 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2020 | 36 | 2020 |
| Impact of interface traps on negative capacitance transistor: Device and circuit reliability O Prakash, A Gupta, G Pahwa, J Henkel, YS Chauhan, H Amrouch IEEE Journal of the Electron Devices Society 8, 1193-1201, 2020 | 34 | 2020 |
| Fefet-based binarized neural networks under temperature-dependent bit errors M Yayla, S Buschjäger, A Gupta, JJ Chen, J Henkel, K Morik, KH Chen, ... IEEE Transactions on Computers 71 (7), 1681-1695, 2021 | 16 | 2021 |
| Performance optimization of analog circuits in negative capacitance transistor technology O Prakash, N Chauhan, A Gupta, H Amrouch Microelectronics Journal 115, 105193, 2021 | 13 | 2021 |
| Traps based reliability barrier on performance and revealing early ageing in negative capacitance FET A Gupta, G Bajpai, P Singhal, N Bagga, O Prakash, S Banchhor, ... 2021 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2021 | 12 | 2021 |
| Impact of radiation on negative capacitance finfet G Bajpai, A Gupta, O Prakash, G Pahwa, J Henkel, YS Chauhan, ... 2020 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2020 | 10 | 2020 |
| Real time implementation of convolutional neural network to detect plant diseases using internet of things G Bajpai, A Gupta, N Chauhan VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India …, 2019 | 10 | 2019 |
| Impact of interface traps induced degradation on negative capacitance FinFET O Prakash, A Gupta, G Pahwa, J Henkel, YS Chauhan, H Amrouch 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-4, 2020 | 9 | 2020 |
| On the critical role of ferroelectric thickness for negative capacitance device-circuit interaction O Prakash, A Gupta, G Pahwa, YS Chauhan, H Amrouch IEEE Journal of the Electron Devices Society 9, 1262-1268, 2021 | 8 | 2021 |
| Pseudo-static 1T capacitorless DRAM using 22nm FDSOI for cryogenic cache memory W Chakraborty, R Saligram, A Gupta, M San Jose, KA Aabrar, S Dutta, ... 2021 IEEE International Electron Devices Meeting (IEDM), 40.1. 1-40.1. 4, 2021 | 7 | 2021 |
| Multi-bit per-cell 1T SiGe floating body RAM for cache memory in cryogenic computing W Chakraborty, P Shrestha, A Gupta, R Saligram, S Spetalnick, ... 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and …, 2022 | 6 | 2022 |
| Variability Effects in FinFET Transistors and Emerging NC-FinFET A Gupta, N Chauhan, O Prakash, H Amrouch 2021 International Conference on IC Design and Technology (ICICDT), 1-4, 2021 | 6 | 2021 |
| On the critical role of ferroelectric thickness for negative capacitance transistor optimization O Prakash, A Gupta, G Pahwa, YS Chauhan, H Amrouch 2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2021 | 3 | 2021 |
| On the resiliency of nc-finfet srams against variation: Mfis structure A Gupta, N Chauhan, O Prakash, H Amrouch 2021 International Conference on Simulation of Semiconductor Processes and …, 2021 | 2 | 2021 |
| Soft errors in negative capacitance fdsoi srams G Bajpai, A Gupta, O Prakash, YS Chauhan, H Amrouch 2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2021 | 2 | 2021 |
| Analysis of DC-DC Sepic converter with different MPPT technique A Gupta, Y Chauhan, R Pachauri, D Sharma, R Chaudhary, P Gupta Proceedings of the 3rd International Conference on Advanced Computing and …, 2021 | 1 | 2021 |
| Study the Impact of Social Media on the Outbreak of COVID-19 Pandemic A Panda, Y Chauhan, V Salawat, A Gupta, SK Pandey European Journal of Molecular and Clinical Medicine, 660-672, 2023 | | 2023 |
| Multi-bit per-cell 1T SiGe Floating Body RAM for Cache Memory in Cryogenic Computing P Shrestha, J Campbell, W Chakraborty, A Gupta, R Saligram, ... Pragya Shrestha, Jason Campbell, Wriddhi Chakraborty, A Gupta, R Saligram, S …, 2022 | | 2022 |
| Unveiling the Impact of Interface Traps Induced on Negative Capacitance Nanosheet FET: A Reliability Perspective A Gupta, G Bajpai, N Bagga, S Banchhor, S Dasgupta, A Bulusu, ... International Symposium on VLSI Design and Test, 85-96, 2022 | | 2022 |
Hussam AmrouchProfessor (W3), Technical University of Munich (TUM)Potvrđena adresa e-pošte na tum.de
