Prati
davor gracin
davor gracin
Potvrđena adresa e-pošte na irb.hr
Naslov
Citirano
Citirano
Godina
Laboratory Real‐Time and In Situ Monitoring of Mechanochemical Milling Reactions by Raman Spectroscopy
D Gracin, V Štrukil, T Friščić, I Halasz, K Užarević
Angewandte Chemie International Edition 53 (24), 6193-6197, 2014
2092014
Mechanochemical C–H bond activation: rapid and regioselective double cyclopalladation monitored by in situ Raman spectroscopy
M Juribašić, K Užarević, D Gracin, M Ćurić
Chemical Communications 50 (71), 10287-10290, 2014
1172014
Mechanochemical reactions studied by in situ Raman spectroscopy: base catalysis in liquid-assisted grinding
M Tireli, MJ Kulcsár, N Cindro, D Gracin, N Biliškov, M Borovina, M Ćurić, ...
Chemical Communications 51 (38), 8058-8061, 2015
862015
Trapping Reactive Intermediates by Mechanochemistry: Elusive Aryl N‐Thiocarbamoylbenzotriazoles as Bench‐Stable Reagents
V Štrukil, D Gracin, OV Magdysyuk, RE Dinnebier, T Friščić
Angewandte Chemie International Edition 54 (29), 8440-8443, 2015
822015
Characterization of a novel avalanche photodiode for single photon detection in VIS-NIR range
M Stipčević, H Skenderović, D Gracin
Optics express 18 (16), 17448-17459, 2010
622010
Correlating Raman-spectroscopy and high-resolution transmission-electron-microscopy studies of amorphous/nanocrystalline multilayered silicon thin films
A Gajović, D Gracin, K Juraić, J Sancho-Parramon, M Čeh
Thin Solid Films 517 (18), 5453-5458, 2009
462009
Nanostructure of thin silicon films by combining HRTEM, XRD and Raman spectroscopy measurements and the implication to the optical properties
A Gajović, D Gracin, I Djerdj, N Tomašić, K Juraić, DS Su
Applied surface science 254 (9), 2748-2754, 2008
432008
Preparation and structure of Cu W thin films
N Radić, B Gržeta, D Gracin, T Car
Thin Solid Films 228 (1-2), 225-228, 1993
401993
Optical spectroscopy study of nc-Si-based p–i–n solar cells
J Sancho-Parramon, D Gracin, M Modreanu, A Gajović
Solar energy materials and solar cells 93 (10), 1768-1772, 2009
352009
Spectral response of amorphous–nano-crystalline silicon thin films
D Gracin, A Gajović, K Juraić, M Čeh, Z Remeš, A Poruba, M Vaněček
Journal of non-crystalline solids 354 (19-25), 2286-2290, 2008
322008
Optical and structural properties of silver nanoparticles in glass matrix formed by thermal annealing of field assisted film dissolution
J Sancho-Parramon, V Janicki, P Dubček, M Karlušić, D Gracin, M Jakšić, ...
Optical Materials 32 (4), 510-514, 2010
292010
Analysis of amorphous-nano-crystalline multilayer structures by optical, photo-deflection and photo-current spectroscopy
D Gracin, J Sancho-Paramon, K Juraić, A Gajović, M Čeh
Micron 40 (1), 56-60, 2009
272009
The influence of thermal annealing on the structural, optical and electrical properties of AZO thin films deposited by magnetron sputtering
D Meljanac, K Juraić, V Mandić, H Skenderović, S Bernstorff, JR Plaisier, ...
Surface and Coatings Technology 321, 292-299, 2017
262017
Soft chemistry synthesis of CaMnO3 powders and films
J Macan, F Brleković, S Kralj, A Supina, D Gracin, A Šantić, A Gajović
Ceramics International 46 (11), 18200-18207, 2020
232020
Microstructural properties of dc magnetron sputtered a-Si: H by IR spectroscopy
D Gracin, UV Desnica, M Ivanda
Journal of non-crystalline solids 149 (3), 257-263, 1992
231992
Study of amorphous nanocrystalline thin silicon films by grazing-incidence small-angle X-ray scattering
D Gracin, S Bernstorff, P Dubcek, A Gajovic, K Juraic
Applied Crystallography 40 (s1), s373-s376, 2007
212007
Characterisation of SiC by IBIC and other IBA techniques
M Jakšić, Ž Bošnjak, D Gracin, Z Medunić, Ž Pastuović, E Vittone, F Nava
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2002
212002
Crystallization of Cu50W50 and Cu66W34 amorphous alloys
B Gržeta, N Radić, D Gracin, T Došlić, T Car
Journal of non-crystalline solids 170 (1), 101-104, 1994
201994
Quantitative analysis of a-Si1− xCx: H thin films by vibrational spectroscopy and nuclear methods
D Gracin, I Bogdanović, V Borjanović, M Jakšić, Ž Pastuović, JM Dutta, ...
Vacuum 61 (2-4), 303-308, 2001
192001
Structural analysis of amorphous-nanocrystalline silicon thin films by grazing incidence X-ray diffraction
K Juraić, D Gracin, I Djerdj, A Lausi, M Čeh, D Balzar
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2012
172012
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