| Recurrent squeeze-and-excitation context aggregation net for single image deraining X Li, J Wu, Z Lin, H Liu, H Zha Proceedings of the European conference on computer vision (ECCV), 254-269, 2018 | 733 | 2018 |
| Expectation Maximization Attention Networks for Semantic Segmentation X Li, Z Zhong, J Wu, Y Yang, Z Lin, H Liu Proceedings of International Conference in Computer Vision (ICCV), 9166-9175, 2019 | 540 | 2019 |
| Quasi-dense similarity learning for multiple object tracking J Pang, L Qiu, X Li, H Chen, Q Li, T Darrell, F Yu Proceedings of the IEEE/CVF conference on computer vision and pattern …, 2021 | 275 | 2021 |
| Improving semantic segmentation via decoupled body and edge supervision X Li, X Li, L Zhang, G Cheng, J Shi, Z Lin, S Tan, Y Tong European Conference on Computer Vision (ECCV), 435-452, 2020 | 216 | 2020 |
| Spatial pyramid based graph reasoning for semantic segmentation X Li, Y Yang, Q Zhao, T Shen, Z Lin, H Liu Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2020 | 155 | 2020 |
| Is attention better than matrix decomposition? Z Geng, MH Guo, H Chen, X Li, K Wei, Z Lin International Conference on Learning Representations (ICLR), 2020 | 99 | 2020 |
| Pointflow: Flowing semantics through points for aerial image segmentation X Li, H He, X Li, D Li, G Cheng, J Shi, L Weng, Y Tong, Z Lin Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2021 | 77 | 2021 |
| Sognet: Scene overlap graph network for panoptic segmentation Y Yang, H Li, X Li, Q Zhao, J Wu, Z Lin Proceedings of the AAAI Conference on Artificial Intelligence (AAAI) 34 (07 …, 2020 | 68 | 2020 |
| Prototypical cross-attention networks for multiple object tracking and segmentation L Ke, X Li, M Danelljan, YW Tai, CK Tang, F Yu Advances in Neural Information Processing Systems (NeurIPS) 34, 1192-1203, 2021 | 60 | 2021 |
| Bi-directional exponential angular triplet loss for RGB-infrared person re-identification H Ye, H Liu, F Meng, X Li IEEE Transactions on Image Processing 30, 1583-1595, 2020 | 55 | 2020 |
| Convolutional neural network‐based multi‐label classification of PCB defects L Zhang, Y Jin, X Yang, X Li, X Duan, Y Sun, H Liu The Journal of Engineering 2018 (16), 1612-1616, 2018 | 45 | 2018 |
| Dynamical system inspired adaptive time stepping controller for residual network families Y Yang, J Wu, H Li, X Li, T Shen, Z Lin Proceedings of the AAAI Conference on Artificial Intelligence (AAAI) 34 (04 …, 2020 | 19 | 2020 |
| Towards efficient scene understanding via squeeze reasoning X Li, X Li, A You, L Zhang, G Cheng, K Yang, Y Tong, Z Lin IEEE Transactions on Image Processing 30, 7050-7063, 2021 | 16 | 2021 |
| Optimization induced equilibrium networks: An explicit optimization perspective for understanding equilibrium models X Xie, Q Wang, Z Ling, X Li, G Liu, Z Lin IEEE Transactions on Pattern Analysis and Machine Intelligence 45 (3), 3604-3616, 2022 | 13 | 2022 |
| R^2 Net Recurrent and Recursive Network for Sparse View CT Artifacts Removal T Shen, X Li, Z Zhong, J Wu, Z Lin Proceedings of Medical Image Computing and Computer Assisted Interventions …, 2019 | 13 | 2019 |
| Towards robust referring image segmentation J Wu, X Li, X Li, H Ding, Y Tong, D Tao arXiv preprint arXiv:2209.09554, 2022 | 12 | 2022 |
| Betrayed by captions: Joint caption grounding and generation for open vocabulary instance segmentation J Wu, X Li, H Ding, X Li, G Cheng, Y Tong, CC Loy Proceedings of International Conference in Computer Vision (ICCV), 2023 | 9 | 2023 |
| Towards open vocabulary learning: A survey J Wu, X Li, SXH Yuan, H Ding, Y Yang, X Li, J Zhang, Y Tong, X Jiang, ... arXiv preprint arXiv:2306.15880, 2023 | 9 | 2023 |
| Self-refining deep symmetry enhanced network for rain removal H Liu, H Ye, X Li, W Shi, M Liu, Q Sun IEEE International Conference on Image Processing (ICIP), 2786-2790, 2019 | 7 | 2019 |
| PCLoss: Fashion landmark estimation with position constraint loss M Song, H Liu, W Shi, X Li Pattern Recognition 118, 108028, 2021 | 3 | 2021 |
Zhouchen LinProfessor, Peking University; Fellow of IEEE, IAPR, CSIG & AAIA; ex-VP of Samsung ResearchPotvrđena adresa e-pošte na pku.edu.cn
