Follow
Vahid Bastani
Vahid Bastani
ASML Netherlands B.V.
Verified email at asml.com
Title
Cited by
Cited by
Year
Activity recognition based on inertial sensors for ambient assisted living
K Davis, E Owusu, V Bastani, L Marcenaro, J Hu, C Regazzoni, L Feijs
2016 19th international conference on information fusion (fusion), 371-378, 2016
882016
Online nonparametric bayesian activity mining and analysis from surveillance video
V Bastani, L Marcenaro, CS Regazzoni
IEEE Transactions on Image Processing 25 (5), 2089-2102, 2016
542016
Image compression based on spatial redundancy removal and image inpainting
V Bastani, MS Helfroush, K Kasiri
Journal of Zhejiang University SCIENCE C 11, 92-100, 2010
432010
Abnormal vessel behavior detection in port areas based on dynamic bayesian networks
F Castaldo, FAN Palmieri, V Bastani, L Marcenaro, C Regazzoni
17th International Conference on Information Fusion (FUSION), 1-7, 2014
342014
Unsupervised trajectory pattern classification using hierarchical Dirichlet Process Mixture hidden Markov model
V Bastani, L Marcenaro, C Regazzoni
2014 IEEE International Workshop on Machine Learning for Signal Processing …, 2014
332014
Perception of emotions from crowd dynamics
MW Baig, MS Baig, V Bastani, EI Barakova, L Marcenaro, CS Regazzoni, ...
2015 IEEE International Conference on Digital Signal Processing (DSP), 703-707, 2015
162015
A Particle Filter Based Sequential Trajectory Classifier for Behavior Analysis in Video Survelliance
V Bastani, L Marcenaro, C Regazzoni
IEEE ICIP 2015, 2015
152015
Online pedestrian group walking event detection using spectral analysis of motion similarity graph
V Bastani, D Campo, L Marcenaro, C Regazzoni
2015 12th IEEE International Conference on Advanced Video and Signal Based …, 2015
142015
Incremental learning of environment interactive structures from trajectories of individuals
D Campo, V Bastani, L Marcenaro, C Regazzoni
2016 19th International Conference on Information Fusion (FUSION), 589-596, 2016
72016
A novel patterning control strategy based on real-time fingerprint recognition and adaptive wafer level scanner optimization
HE Cekli, J Nije, A Ypma, V Bastani, D Sonntag, H Niesing, L Zhang, ...
Metrology, Inspection, and Process Control for Microlithography XXXII 10585 …, 2018
52018
Method to label substrates based on process parameters
V Bastani, A Ypma, D Sonntag, EC Mos, HE Cekli, C Lin
US Patent App. 16/960,376, 2020
42020
Online Bayesian learning and classification of ship-to-ship interactions for port safety
F Castaldo, FAN Palmieri, V Bastani, L Marcenaro, C Regazzoni
2014 11th IEEE International Conference on Advanced Video and Signal Based …, 2014
42014
Method to label substrates based on process parameters
V Bastani, A Ypma
US Patent 11,320,743, 2022
22022
Maintaining a set of process fingerprints
A Ypma, V Bastani, D Sonntag, N Jelle, HE Cekli, G Tsirogiannis, ...
US Patent 11,099,485, 2021
22021
Method for determining contribution to a fingerprint
D Harutyunyan, F Jia, F Staals, F Wang, HT Looijestijn, CJ Rijnierse, ...
US Patent 10,816,904, 2020
22020
Method for determining contribution to a fingerprint
D Harutyunyan, F Jia, F Staals, F Wang, HT Looijestijn, CJ Rijnierse, ...
US Patent 11,378,891, 2022
12022
METHOD TO PREDICT METROLOGY OFFSET OF A SEMICONDUCTOR MANUFACTURING PROCESS
GT Dos Santos, M Ishibashi, N Sanno, V Bastani, R Sahraeian, P Saputra
US Patent App. 18/276,014, 2024
2024
Method and apparatus for identifying contamination in a semiconductor fab
TP Collignon, S Pavel, CE Tabery, TDOSS GUZELLA, V Bastani
US Patent App. 18/016,811, 2023
2023
Method for classifying semiconductor wafers
V Bastani, D Gkorou, R Sahraeian, CE Tabery
US Patent App. 18/013,636, 2023
2023
Configuration of an imputer model
R Sahraeian, V Bastani, D Gkorou, TDOSS GUZELLA
US Patent App. 17/913,305, 2023
2023
The system can't perform the operation now. Try again later.
Articles 1–20