| Impact of variability on processor performance in negative capacitance finfet technology H Amrouch, G Pahwa, AD Gaidhane, CK Dabhi, F Klemme, O Prakash, ... IEEE Transactions on Circuits and Systems I: Regular Papers 67 (9), 3127-3137, 2020 | 56 | 2020 |
| Machine learning for on-the-fly reliability-aware cell library characterization F Klemme, H Amrouch IEEE Transactions on Circuits and Systems I: Regular Papers 68 (6), 2569-2579, 2021 | 26 | 2021 |
| Modeling emerging technologies using machine learning: Challenges and opportunities F Klemme, J Prinz, VM van Santen, J Henkel, H Amrouch Proceedings of the 39th International Conference on Computer-Aided Design, 1-9, 2020 | 25 | 2020 |
| Scalable machine learning to estimate the impact of aging on circuits under workload dependency F Klemme, H Amrouch IEEE Transactions on Circuits and Systems I: Regular Papers 69 (5), 2142-2155, 2022 | 19 | 2022 |
| Cell library characterization using machine learning for design technology co-optimization F Klemme, Y Chauhan, J Henkel, H Amrouch Proceedings of the 39th International Conference on Computer-Aided Design, 1-9, 2020 | 19 | 2020 |
| GNN4REL: Graph neural networks for predicting circuit reliability degradation L Alrahis, J Knechtel, F Klemme, H Amrouch, O Sinanoglu IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2022 | 12 | 2022 |
| Machine learning for circuit aging estimation under workload dependency F Klemme, H Amrouch 2021 IEEE International Test Conference (ITC), 37-46, 2021 | 12 | 2021 |
| Impact of ncfet technology on eliminating the cooling cost and boosting the efficiency of google tpu S Salamin, G Zervakis, F Klemme, H Kattan, Y Chauhan, J Henkel, ... IEEE Transactions on Computers 71 (4), 906-918, 2021 | 11 | 2021 |
| Efficient learning strategies for machine learning-based characterization of aging-aware cell libraries F Klemme, H Amrouch IEEE Transactions on Circuits and Systems I: Regular Papers 69 (12), 5233-5246, 2022 | 9 | 2022 |
| On extracting reliability information from speed binning ZP Najafi-Haghi, F Klemme, H Amrouch, HJ Wunderlich 2022 IEEE European Test Symposium (ETS), 1-4, 2022 | 6 | 2022 |
| Intelligent methods for test and reliability H Amrouch, J Anders, S Becker, M Betka, G Bleher, P Domanski, ... 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), 969-974, 2022 | 6 | 2022 |
| Design close to the edge for advanced technology using machine learning and brain-inspired algorithms H Amrouch, F Klemme, PR Genssler 2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC), 493-499, 2022 | 5 | 2022 |
| Upheaving self-heating effects from transistor to circuit level using conventional EDA tool flows F Klemme, S Salamin, H Amrouch 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2023 | 4 | 2023 |
| Variability-aware approximate circuit synthesis via genetic optimization K Balaskas, F Klemme, G Zervakis, K Siozios, H Amrouch, J Henkel IEEE Transactions on Circuits and Systems I: Regular Papers 69 (10), 4141-4153, 2022 | 3 | 2022 |
| ML to the rescue: Reliability estimation from self-heating and aging in transistors all the way up processors H Amrouch, F Klemme Proceedings of the 28th Asia and South Pacific Design Automation Conference …, 2023 | 2 | 2023 |
| SyncTREE: Fast Timing Analysis for Integrated Circuit Design through a Physics-informed Tree-based Graph Neural Network Y Hu, J Li, F Klemme, GJ Nam, T Ma, H Amrouch, J Xiong Advances in Neural Information Processing Systems 36, 2024 | 1 | 2024 |
| Approximation-aware and quantization-aware training for graph neural networks R Novkin, H Amrouch, F Klemme Authorea Preprints, 2023 | 1 | 2023 |
| Design Automation for Cryogenic CMOS Circuits VM van Santen, M Walter, F Klemme, SS Parihar, G Pahwa, YS Chauhan, ... 2023 60th ACM/IEEE Design Automation Conference (DAC), 1-6, 2023 | 1 | 2023 |
| Robust Resistive Open Defect Identification Using Machine Learning with Efficient Feature Selection ZP Najafi-Haghi, F Klemme, H Jafarzadeh, H Amrouch, HJ Wunderlich 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-2, 2023 | 1 | 2023 |
| Mitigating the Complexity of Chip Designs with ML-based Cell Library Characterization F Klemme, H Amrouch Workshop on Intelligent Methods for Test and Reliability, 2022 | 1 | 2022 |
Hussam AmrouchProfessor (W3), Technical University of Munich (TUM)Potvrđena adresa e-pošte na tum.de
