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Sve | Od 2019. | |
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Citati | 3604 | 3097 |
H-indeks | 21 | 20 |
i10-indeks | 27 | 27 |
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Suautori
- He Tian (田禾)Tsinghua UniversityPotvrđena adresa e-pošte na tsinghua.edu.cn
- Wentian MiUC BerkeleyPotvrđena adresa e-pošte na berkeley.edu
- Cheng LiElectrical Engineering, Yale UniversityPotvrđena adresa e-pošte na yale.edu
- Lu-Qi TaoThe University of Science and Technology BeijingPotvrđena adresa e-pošte na ustb.edu.cn
- Qianyi XieApplied Materials Inc.Potvrđena adresa e-pošte na amat.com
- Zhi BieTsinghua University, Stanford UniversityPotvrđena adresa e-pošte na stanford.edu
- Po-Wen ChiuDepartment of Electrical Engineering, Nation Tsing Hua UniversityPotvrđena adresa e-pošte na ee.nthu.edu.tw
- H.-S. Philip WongProfessor of Electrical Engineering, Stanford UniversityPotvrđena adresa e-pošte na stanford.edu
- Hong-Yu (Henry) ChenGigaDevice Semiconductor Inc.Potvrđena adresa e-pošte na gigadevice.com
- Ya-Long CuiPh.D. Candidate of Microelectronics, Tsinghua UniversityPotvrđena adresa e-pošte na mails.tsinghua.edu.cn
- Ningqin DengNational Institute of Metrology (NIM), Beijing 100029, China