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Evelin Fisslthaler
Evelin Fisslthaler
Graz Centre for Electron Microscopy
Verified email at felmi-zfe.at
Title
Cited by
Cited by
Year
On the discrimination of semi-graphite and graphite by Raman spectroscopy
G Rantitsch, W Lämmerer, E Fisslthaler, S Mitsche, H Kaltenböck
International Journal of Coal Geology 159, 48-56, 2016
1032016
High resolution electron microscopy of Ag-clusters in crystalline and non-crystalline morphologies grown inside superfluid helium nanodroplets
A Volk, P Thaler, M Koch, E Fisslthaler, W Grogger, WE Ernst
The Journal of chemical physics 138 (21), 2013
792013
Printing functional nanostructures: a novel route towards nanostructuring of organic electronic devices via soft embossing, inkjet printing and colloidal self assembly of …
E Fisslthaler, A Blümel, K Landfester, U Scherf, EJW List
Soft Matter 4 (12), 2448-2453, 2008
582008
Inkjet printed polymer light-emitting devices fabricated by thermal embedding of semiconducting polymer nanospheres in an inert matrix
E Fisslthaler, S Sax, U Scherf, G Mauthner, E Moderegger, K Landfester, ...
Applied Physics Letters 92 (18), 2008
482008
An investigation on focused electron/ion beam induced degradation mechanisms of conjugated polymers
M Sezen, H Plank, E Fisslthaler, B Chernev, A Zankel, E Tchernychova, ...
Physical Chemistry Chemical Physics 13 (45), 20235-20240, 2011
382011
SensLED: An electro-optical active probe for oxygen determination
S Sax, E Fisslthaler, S Kappaun, C Konrad, K Waich, T Mayr, C Slugovc, ...
sl: Advanced Materials, Vols 21, 3483-3487, 2009
232009
Synthesis of graphene-layer nanosheet coatings by PECVD
R Kaindl, G Jakopic, R Resel, J Pichler, A Fian, E Fisslthaler, W Grogger, ...
Materials Today: Proceedings 2 (8), 4247-4255, 2015
172015
Ion beam degradation analysis of poly (3-hexylthiophene)(P3HT): can cryo-FIB minimize irradiation damage?
M Sezen, H Plank, PM Nellen, S Meier, B Chernev, W Grogger, ...
Physical Chemistry Chemical Physics 11 (25), 5130-5133, 2009
162009
Impact of the NO Anneal on the Microscopic Structure and Chemical Composition of the Si‐Face 4H‐SiC/SiO2 Interface
G Gruber, C Gspan, E Fisslthaler, M Dienstleder, G Pobegen, T Aichinger, ...
Advanced Materials Interfaces 5 (12), 1800022, 2018
152018
Direct Sub‐Micrometer‐Patterning of Conjugated Polymers and Polymer Light‐Emitting Devices by Electron Beam Lithography
E Fisslthaler, M Sezen, H Plank, A Blümel, S Sax, W Grogger, EJW List
Macromolecular Chemistry and Physics 211 (13), 1402-1407, 2010
132010
Influence of growth temperature on the properties of aluminum nitride thin films prepared by magnetron sputter epitaxy
B Sundarapandian, A Yassine, L Kirste, M Baeumler, P Straňák, ...
Journal of Applied Physics 134 (18), 2023
102023
The performance of EDXS at elevated sample temperatures using a MEMS-based in situ TEM heating system
R Krisper, J Lammer, Y Pivak, E Fisslthaler, W Grogger
Ultramicroscopy 234, 113461, 2022
102022
Iron-rich talc as air-stable platform for magnetic two-dimensional materials
A Matković, L Ludescher, OE Peil, A Sharma, KP Gradwohl, M Kratzer, ...
npj 2D Materials and Applications 5 (1), 94, 2021
92021
Note: On the deconvolution of Kelvin probe force microscopy data
A Blümel, H Plank, A Klug, E Fisslthaler, M Sezen, W Grogger, EJW List
Review of Scientific Instruments 81 (5), 2010
72010
An EBIC model for TCAD simulation to determine the surface recombination rate in semiconductor devices
A Kraxner, F Roger, B Loeffler, M Faccinelli, E Fisslthaler, R Minixhofer, ...
IEEE Transactions on Electron Devices 63 (11), 4395-4401, 2016
52016
AlYN thin films with high Y content: microstructure and performance
D Solonenko, J Strube, J Fammels, E Fisslthaler, V Röbisch, K Howell, ...
physica status solidi (RRL)–Rapid Research Letters 17 (10), 2300193, 2023
42023
High-resolution cross-sectional analysis of the interface between SiC and SiO2 in a MOSFET device via atomic resolution STEM
E Fisslthaler, G Haberfehlner, C Gspan, G Gruber, W Grogger
Microelectronics Reliability 100, 113366, 2019
22019
Erratum to:" On the discrimination of semi-graphite and graphite by Raman spectroscopy"
G Rantitsch, W Lämmerer, E Fisslthaler, S Mitsche, H Kaltenböck
International Journal of Coal Geology 167, 238-238, 2016
22016
Low energy argon ion sample preparation for HRSTEM analysis
M Dienstleder, E Fisslthaler, C Gspan, G Kothleitner
7. ASEM workshop of the Austrian Society of Electron Microscopy, 2017
12017
TEM Sample Preparation of a Hard Metal by Semiautomatic Wedge Polishing
SM Neumayer, E Fisslthaler, S Feistritzer, W Grogger
Practical Metallography 50 (5), 304-317, 2013
12013
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