On the discrimination of semi-graphite and graphite by Raman spectroscopy G Rantitsch, W Lämmerer, E Fisslthaler, S Mitsche, H Kaltenböck International Journal of Coal Geology 159, 48-56, 2016 | 103 | 2016 |
High resolution electron microscopy of Ag-clusters in crystalline and non-crystalline morphologies grown inside superfluid helium nanodroplets A Volk, P Thaler, M Koch, E Fisslthaler, W Grogger, WE Ernst The Journal of chemical physics 138 (21), 2013 | 79 | 2013 |
Printing functional nanostructures: a novel route towards nanostructuring of organic electronic devices via soft embossing, inkjet printing and colloidal self assembly of … E Fisslthaler, A Blümel, K Landfester, U Scherf, EJW List Soft Matter 4 (12), 2448-2453, 2008 | 58 | 2008 |
Inkjet printed polymer light-emitting devices fabricated by thermal embedding of semiconducting polymer nanospheres in an inert matrix E Fisslthaler, S Sax, U Scherf, G Mauthner, E Moderegger, K Landfester, ... Applied Physics Letters 92 (18), 2008 | 48 | 2008 |
An investigation on focused electron/ion beam induced degradation mechanisms of conjugated polymers M Sezen, H Plank, E Fisslthaler, B Chernev, A Zankel, E Tchernychova, ... Physical Chemistry Chemical Physics 13 (45), 20235-20240, 2011 | 38 | 2011 |
SensLED: An electro-optical active probe for oxygen determination S Sax, E Fisslthaler, S Kappaun, C Konrad, K Waich, T Mayr, C Slugovc, ... sl: Advanced Materials, Vols 21, 3483-3487, 2009 | 23 | 2009 |
Synthesis of graphene-layer nanosheet coatings by PECVD R Kaindl, G Jakopic, R Resel, J Pichler, A Fian, E Fisslthaler, W Grogger, ... Materials Today: Proceedings 2 (8), 4247-4255, 2015 | 17 | 2015 |
Ion beam degradation analysis of poly (3-hexylthiophene)(P3HT): can cryo-FIB minimize irradiation damage? M Sezen, H Plank, PM Nellen, S Meier, B Chernev, W Grogger, ... Physical Chemistry Chemical Physics 11 (25), 5130-5133, 2009 | 16 | 2009 |
Impact of the NO Anneal on the Microscopic Structure and Chemical Composition of the Si‐Face 4H‐SiC/SiO2 Interface G Gruber, C Gspan, E Fisslthaler, M Dienstleder, G Pobegen, T Aichinger, ... Advanced Materials Interfaces 5 (12), 1800022, 2018 | 15 | 2018 |
Direct Sub‐Micrometer‐Patterning of Conjugated Polymers and Polymer Light‐Emitting Devices by Electron Beam Lithography E Fisslthaler, M Sezen, H Plank, A Blümel, S Sax, W Grogger, EJW List Macromolecular Chemistry and Physics 211 (13), 1402-1407, 2010 | 13 | 2010 |
Influence of growth temperature on the properties of aluminum nitride thin films prepared by magnetron sputter epitaxy B Sundarapandian, A Yassine, L Kirste, M Baeumler, P Straňák, ... Journal of Applied Physics 134 (18), 2023 | 10 | 2023 |
The performance of EDXS at elevated sample temperatures using a MEMS-based in situ TEM heating system R Krisper, J Lammer, Y Pivak, E Fisslthaler, W Grogger Ultramicroscopy 234, 113461, 2022 | 10 | 2022 |
Iron-rich talc as air-stable platform for magnetic two-dimensional materials A Matković, L Ludescher, OE Peil, A Sharma, KP Gradwohl, M Kratzer, ... npj 2D Materials and Applications 5 (1), 94, 2021 | 9 | 2021 |
Note: On the deconvolution of Kelvin probe force microscopy data A Blümel, H Plank, A Klug, E Fisslthaler, M Sezen, W Grogger, EJW List Review of Scientific Instruments 81 (5), 2010 | 7 | 2010 |
An EBIC model for TCAD simulation to determine the surface recombination rate in semiconductor devices A Kraxner, F Roger, B Loeffler, M Faccinelli, E Fisslthaler, R Minixhofer, ... IEEE Transactions on Electron Devices 63 (11), 4395-4401, 2016 | 5 | 2016 |
AlYN thin films with high Y content: microstructure and performance D Solonenko, J Strube, J Fammels, E Fisslthaler, V Röbisch, K Howell, ... physica status solidi (RRL)–Rapid Research Letters 17 (10), 2300193, 2023 | 4 | 2023 |
High-resolution cross-sectional analysis of the interface between SiC and SiO2 in a MOSFET device via atomic resolution STEM E Fisslthaler, G Haberfehlner, C Gspan, G Gruber, W Grogger Microelectronics Reliability 100, 113366, 2019 | 2 | 2019 |
Erratum to:" On the discrimination of semi-graphite and graphite by Raman spectroscopy" G Rantitsch, W Lämmerer, E Fisslthaler, S Mitsche, H Kaltenböck International Journal of Coal Geology 167, 238-238, 2016 | 2 | 2016 |
Low energy argon ion sample preparation for HRSTEM analysis M Dienstleder, E Fisslthaler, C Gspan, G Kothleitner 7. ASEM workshop of the Austrian Society of Electron Microscopy, 2017 | 1 | 2017 |
TEM Sample Preparation of a Hard Metal by Semiautomatic Wedge Polishing SM Neumayer, E Fisslthaler, S Feistritzer, W Grogger Practical Metallography 50 (5), 304-317, 2013 | 1 | 2013 |