Prati
Lin Zhao
Lin Zhao
Potvrđena adresa e-pošte na e.ntu.edu.sg
Naslov
Citirano
Citirano
Godina
Temporal analysis of the entire ethereum blockchain network
L Zhao, S Sen Gupta, A Khan, R Luo
Proceedings of the Web Conference 2021, 2258-2269, 2021
542021
Prediction of electrical and physical failure analysis success using artificial neural networks
L Zhao, SH Goh, YH Chan, BL Yeoh, H Hu, MH Thor, A Tan, J Lam
2018 IEEE international symposium on the physical and failure analysis of …, 2018
202018
A detailed analysis scheme to interpret multiple photon emissions micrograph for improved diagnostic resolution on open defects
SH Goh, EC Manlangit, E Susanto, BL Yeoh, H Hao, A Tan, HHW Ma, ...
2017 IEEE 24th International Symposium on the Physical and Failure Analysis …, 2017
62017
Optimization of an artificial neural network system for the prediction of failure analysis success
L Zhao, SH Goh, YH Chan, BL Yeoh, H Hu, MH Thor, A Tan, J Lam
Microelectronics Reliability 92, 136-142, 2019
52019
Localization of embedded memories using EeLADA
MH Thor, SH Goh, L Zhao, BL Yeoh, YT Ngow, H Hao, YH Chan, J Lam
International Symposium for Testing and Failure Analysis 81009, 176-182, 2018
52018
Defect isolation methods and systems
SH Goh, YH Chan, BL Yeoh, JCK Lam, L Zhao
US Patent 9,958,502, 2018
52018
Take a Closer Look at Electrically-Enhanced LADA: Setup
SH Goh, BL Yeoh, GF You, YH Chan, Z Lin, J Lam, CM Chua
EDFA Technical Articles 18 (3), 10-16, 2016
52016
Fault Localization Using Dynamic Optical-beam Induced Current Variation Mapping
MH Thor, SH Goh, BL Yeoh, H Hao, YH Chan, Z Lin
2019 IEEE 26th International Symposium on Physical and Failure Analysis of …, 2019
32019
Experimental Demonstration of the Effects of Laser Pulse Duration on SEU and LADA in CMOS Devices
SH Goh, BL Yeoh, H Hao, YH Chan, Z Lin, GF You, J Lam, LS Koh, ...
International Symposium for Testing and Failure Analysis 81368, 547-554, 2016
32016
A demonstration on the effectiveness of wafer-level thermal microscopy as a complementary tool to photon emission microscopy using MBIST Failure debug
BL Yeoh, SH Goh, MH Thor, H Hao, A Tan, YH Chan, Z Lin, SP Neo, ...
2018 IEEE International Symposium on the Physical and Failure Analysis of …, 2018
22018
Faster Localization of Logic Soft Failures Using a Combination of Scan Diagnosis at Reduced VDD and LADA
SH Goh, YT Ngow, BL Yeoh, E Susanto, H Hao, MH Thor, Z Lin, YH Chan, ...
2018 IEEE International Symposium on the Physical and Failure Analysis of …, 2018
22018
Concurrent built-in self-testing under the constraint of shared test resources and its test time reduction
SH Goh, YH Chan, Z Lin, J Lam
Integration 59, 198-205, 2017
22017
Optimization of EeLADA for Circuit Logic Defect Localization Using Defect Simulation
M Lee, BL Yeoh, SH Goh, GF You, A Tan, H Hao, YH Chan, L Zhao, ...
International Symposium for Testing and Failure Analysis 81368, 540-546, 2016
22016
ShaderNet: graph-based shader code analysis to accelerate GPU's performance improvement
L Zhao, A Khan, R Luo
Proceedings of the 5th ACM SIGMOD Joint International Workshop on Graph Data …, 2022
12022
Dynamic optical beam induced current variation mapping: A fault isolation technique
MH Thor, SH Goh, BL Yeoh, H Hao, YH Chan, Z Lin
Microelectronics Reliability 107, 113603, 2020
12020
Overview of Wafer-level Electrical Failure Analysis Process for Accelerated Yield Engineering
SH Goh, YH Chan, BL Yeoh, H Hao, MH Thor, Z Lin, CM Chua, SH Tan, ...
12019
Accurate memory bitmapping based on built-in self-test: challenges and solutions
L Zhao, YT Ngow, SH Goh, YH Chan, H Hu, F Jeff, CC Tay
2019 IEEE 26th International Symposium on Physical and Failure Analysis of …, 2019
12019
Anomalous Wafer Map Detection and Localization using Unsupervised Learning
L Zhao, CK Yeo
The 20th International Conference on IC Design and Technology, 2023
2023
Graph Mining and Machine Learning for Shader Codes Analysis to Accelerate GPU Tuning
L Zhao, A Khan, R Luo, CK Yeo
International Conference on Complex Networks and Their Applications, 426-439, 2022
2022
Defect localization in embedded memory
SHWS GOH, YH Chan, BL Yeoh, L Zhao, MH Thor
US Patent 10,962,592, 2021
2021
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