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Hyungrok Do
Hyungrok Do
Assistant Professor at NYU Grossman School of Medicine
Verified email at nyu.edu - Homepage
Title
Cited by
Cited by
Year
Outer-points shaver: Robust graph-based clustering via node cutting
Y Kim, H Do, SB Kim
Pattern Recognition 97, 107001, 2020
212020
Factors associated with hospital admission and severe outcomes for older patients with COVID‐19
J Kim, C Blaum, R Ferris, M Arcila‐Mesa, H Do, C Pulgarin, J Dolle, ...
Journal of the American Geriatrics Society 70 (7), 1906-1917, 2022
152022
Fair generalized linear models with a convex penalty
H Do, P Putzel, AS Martin, P Smyth, J Zhong
International Conference on Machine Learning, 5286-5308, 2022
82022
Graph structured sparse subset selection
H Do, MS Cheon, SB Kim
Information Sciences 518, 71-94, 2020
62020
Hierarchical segment-channel attention network for explainable multichannel signal classification
J Lee, H Do, M Kwak, H Kahng, SB Kim
Information Sciences 567, 312-331, 2021
52021
A joint fairness model with applications to risk predictions for underrepresented populations
H Do, S Nandi, P Putzel, P Smyth, J Zhong
Biometrics 79 (2), 826-840, 2023
42023
Dynamic survival analysis for ehr data with personalized parametric distributions
P Putzel, H Do, A Boyd, H Zhong, P Smyth
Machine Learning for Healthcare Conference, 648-673, 2021
32021
Domain Generalization via Heckman-type Selection Models
H Kahng, H Do, J Zhong
The Eleventh International Conference on Learning Representations, 2022
22022
Proximity-based density description with regularized reconstruction algorithm for anomaly detection
J Yu, H Do
Information Sciences 654, 119816, 2024
12024
A Hierarchical Spatial-Test Attention Network for Explainable Multiple Wafer Bin Maps Classification
H Do, C Lee, SB Kim
IEEE Transactions on Semiconductor Manufacturing 35 (1), 78-86, 2021
12021
Fair Survival Time Prediction via Mutual Information Minimization
H Do, Y Chang, YS Cho, P Smyth, J Zhong
Machine Learning for Healthcare Conference, 2023
2023
Early Diagnosis and Prediction of Wafer Quality Using Machine Learning on sub-10nm Logic Technology
HK Ko, S Park, J Ryu, SR Kim, G Lee, D Lee, S Pae, E Lee, Y Ji, H Jiang, ...
2020 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2020
2020
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Articles 1–12