Federico Bisti
Observation of Weyl nodes in TaAs
BQ Lv, N Xu, HM Weng, JZ Ma, P Richard, XC Huang, LX Zhao, GF Chen, ...
Nature Physics 11 (9), 724-727, 2015
Response to NO2 and other gases of resistive chemically exfoliated MoS2-based gas sensors
M Donarelli, S Prezioso, F Perrozzi, F Bisti, M Nardone, L Giancaterini, ...
Sensors and Actuators B: Chemical 207, 602-613, 2015
Observation of Weyl nodes and Fermi arcs in tantalum phosphide
N Xu, HM Weng, BQ Lv, CE Matt, J Park, F Bisti, VN Strocov, D Gawryluk, ...
Nature communications 7 (1), 11006, 2016
Tunable sulfur desorption in exfoliated MoS2 by means of thermal annealing in ultra-high vacuum
M Donarelli, F Bisti, F Perrozzi, L Ottaviano
Chemical Physics Letters 588, 198-202, 2013
Evidence for a Strong Topological Insulator Phase in
G Manzoni, L Gragnaniello, G Autès, T Kuhn, A Sterzi, F Cilento, ...
Physical Review Letters 117 (23), 237601, 2016
Direct observation of how the heavy-fermion state develops in
QY Chen, DF Xu, XH Niu, J Jiang, R Peng, HC Xu, CHP Wen, ZF Ding, ...
Physical Review B 96 (4), 045107, 2017
Disentangling bulk and surface Rashba effects in ferroelectric -GeTe
J Krempaský, H Volfová, S Muff, N Pilet, G Landolt, M Radović, M Shi, ...
Physical Review B 94 (20), 205111, 2016
Entanglement and manipulation of the magnetic and spin–orbit order in multiferroic Rashba semiconductors
J Krempaský, S Muff, F Bisti, M Fanciulli, H Volfová, AP Weber, N Pilet, ...
Nature Communications 7 (1), 13071, 2016
Large area extreme-UV lithography of graphene oxide via spatially resolved photoreduction
S Prezioso, F Perrozzi, M Donarelli, F Bisti, S Santucci, L Palladino, ...
Langmuir 28 (12), 5489-5495, 2012
Band Dependent Interlayer -Electron Hybridization in
QY Chen, DF Xu, XH Niu, R Peng, HC Xu, CHP Wen, X Liu, L Shu, ...
Physical review letters 120 (6), 066403, 2018
Use of optical contrast to estimate the degree of reduction of graphene oxide
F Perrozzi, S Prezioso, M Donarelli, F Bisti, P De Marco, S Santucci, ...
The Journal of Physical Chemistry C 117 (1), 620-625, 2013
Electronic and geometric structure of graphene/SiC (0001) decoupled by lithium intercalation
F Bisti, G Profeta, H Vita, M Donarelli, F Perrozzi, PM Sheverdyaeva, ...
Physical Review B 91 (24), 245411, 2015
Band structure of the EuO/Si interface: justification for silicon spintronics
LL Lev, DV Averyanov, AM Tokmachev, F Bisti, VA Rogalev, VN Strocov, ...
Journal of Materials Chemistry C 5 (1), 192-200, 2017
Fingerprints of the hydrogen bond in the photoemission spectra of croconic acid condensed phase: An x-ray photoelectron spectroscopy and ab-initio study
F Bisti, A Stroppa, S Picozzi, L Ottaviano
The Journal of chemical physics 134 (17), 174505, 2011
Distinct evolutions of Weyl fermion quasiparticles and Fermi arcs with bulk band topology in Weyl semimetals
N Xu, G Autès, CE Matt, BQ Lv, MY Yao, F Bisti, VN Strocov, D Gawryluk, ...
Physical review letters 118 (10), 106406, 2017
Weakly-correlated nature of ferromagnetism in non symmorphic CrO2 revealed by bulk-sensitive soft X ray ARPES
F Bisti, VA Rogalev, M Karolak, S Paul, A Gupta, T Schmitt, G Güntherodt, ...
Physical Review X 7, 041067, 2017
Adsorption of water and ammonia on graphene: evidence for chemisorption from X-ray absorption spectra
S Böttcher, H Vita, M Weser, F Bisti, YS Dedkov, K Horn
The Journal of Physical Chemistry Letters 8 (15), 3668-3672, 2017
The electronic structure of gas phase croconic acid compared to the condensed phase: More insight into the hydrogen bond interaction
F Bisti, A Stroppa, F Perrozzi, M Donarelli, S Picozzi, M Coreno, ...
The Journal of Chemical Physics 138 (1), 014308, 2013
Few layered MoS 2 lithography with an AFM tip: description of the technique and nanospectroscopy investigations
M Donarelli, F Perrozzi, F Bisti, F Paparella, V Feyer, A Ponzoni, ...
Nanoscale 7 (26), 11453-11459, 2015
Local surface morphology and chemistry of SnO2 thin films deposited by rheotaxial growth and thermal oxidation method for gas sensor application
L Ottaviano, M Kwoka, F Bisti, P Parisse, V Grossi, S Santucci, J Szuber
Thin Solid Films 517 (22), 6161-6169, 2009
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